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Mitutoyo, 157-110, Series 157 Optical Parallel, 0-1" Range, 0.5062" Thickness of Parallel
Designed to inspect parallelism and flatness of measuring faces of micrometers.
Parallelism check between measuring faces by means of interference fringe produced by an optical parallel. The parallelism between the measuring faces can be determined as follows-place the optical parallel to the anvil and observe the number of interference fringes produced on the spindle side under the measuring force of the micrometers. The parallelism is about 1µm (0.32µmx3 = 0.96µm). Fringe on the anvil side must not be more than one.
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